Thursday, July 2, 2009

Parallel Electron Beam Lithography Stamps

Electron beam lithography is typically limited to scientific investigation or small volume production since it is so much slower than optical lithography. However, using a high density of electron emitting sources the speed of e-beam lithography can be scaled up which is the approach taken by companies such as Multibeam Systems and Mapper Lithography.

I have had a few of my patents issue recently teaching nanostructured electron emission tips formed on the surface of a stamp structure to perform a form of parallel electron beam lithography.

US Patent 7,425,715 - Digital parallel electron beam lithography stamp

This patent teaches an addressing system for a high density array of carbon nanotube electron emitters controlled to generate a digital mask for patterning a substrate.

US Patent 7,550,747 - Parallel electron beam lithography stamp

This patent teaches a patterned array of carbon nanotube electron emitters which replicate a mask pattern and a second array of carbon nanotubes forming an alignment reference with a target substrate.

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